NEWS
AAM: Technology, Interpretation, and Education 2010 Online Conference
TIE 2010 is a multi-day, multi-session online conference that provides an interactive forum for museum professionals at all levels to explore current technology trends and practices in museum education, interpretation, exhibition, public programs, and outreach.
Are you developing new exhibitions, interpretive programs, or public spaces that involve technology? Join us for the upcoming online conference, AAM Technology, Interpretation, and Education 2010 (TIE 2010).
TIE 2010 is a multi-day, multi-session online conference that provides an interactive forum for museum professionals at all levels to explore current technology trends and practices in museum education, interpretation, exhibition, public programs, and outreach. Participants will engage with technologists, education/interpretation specialists, and other expert practitioners to examine technology and new media projects that support the interpretation of collections and enhance learning experiences.
To register or for more information, please visit www.aam-us.org.
